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LIN Panpan, YANG Jia, BU Lanbin, Lin Tiesong, LONG Weiming. Microstructure evolution and joining mechanism of brazing (Cf-SiCf)/SiBCN to Nb with TiZrNiCu[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2019, 40(9): 7-13. DOI: 10.12073/j.hjxb.2019400227
Citation: LIN Panpan, YANG Jia, BU Lanbin, Lin Tiesong, LONG Weiming. Microstructure evolution and joining mechanism of brazing (Cf-SiCf)/SiBCN to Nb with TiZrNiCu[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2019, 40(9): 7-13. DOI: 10.12073/j.hjxb.2019400227

Microstructure evolution and joining mechanism of brazing (Cf-SiCf)/SiBCN to Nb with TiZrNiCu

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  • Received Date: October 31, 2018
  • In this work, TiZrNiCu was proposed to realize the joining of the improved high temperature ceramic (C f-SiCf)/SiBCN and Nb. The effects of brazing temperature and holding time on interface microstructure and mechanical properties were investigated, and the joining mechanism was detailed described. The joint shear strength reached maximum of 36 MPa at 900℃/20 min, in which typical interface structure was SiBCN/TiC+ZrC/Ti 5Si3 +Zr 5Si3/(Ti,Zr) 2 (Cu,Ni)/(Ti-Nb)ss/Nb. During the brazing process, Cu-Si brittle compounds were formed in the ceramic by infiltration of Cu into the (C f-SiCf)/SiBCN, responsible for the fracture path extended from the solder layer to the ceramic side in most cases. When the holding time was 30 min, the joint was directly broken on the ceramic base material due to the excessive penetration effect of Cu; at excessive temperature, the fracture occured in the filler, since the large difference between the (Ti-Nb)ss and the solder materials.
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