Advanced Search
LI Geng, WANG Shang, SUN Yuxin, MENG Junhao, WU Wenzhi, TIAN Yanhong. Reliability optimization of solder joints in large-sized COTS devices based on solder mask layer design[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION. DOI: 10.12073/j.hjxb.20240319003
Citation: LI Geng, WANG Shang, SUN Yuxin, MENG Junhao, WU Wenzhi, TIAN Yanhong. Reliability optimization of solder joints in large-sized COTS devices based on solder mask layer design[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION. DOI: 10.12073/j.hjxb.20240319003

Reliability optimization of solder joints in large-sized COTS devices based on solder mask layer design

More Information
  • Received Date: March 18, 2024
  • Available Online: September 26, 2024
  • High reliability application fields often require specialized devices, which have slower iteration updates and higher costs. COTS devices have a fast update speed and good quality consistency, but their applicability and reliability in specialized fields have not been fully verified. Therefore, a reliability method for large-size COTS device solder joints based on solder mask layer design is proposed. Firstly, solder joint morphology simulation is used to obtain solder joint morphology under different solder mask layer parameters; Furthermore, plate level thermal cycling simulations were conducted on devices with different parameters. The results showed that the design of the solder mask layer would affect the shape of the solder joints, thereby affecting their stress-strain state during the thermal cycling process. The optimized parameters were obtained by calculating the expected lifespan of the solder joints, and the predicted lifespan of the optimized solder joints was increased by 118%. This proved the feasibility of improving the reliability of COTS device solder joints from the perspective of packaging design, and promoted the application process of COTS devices in the field of high reliability.

  • [1]
    DI R R, BRANDOLINI E, SPARVIERI G, et al. Best practices on adopting open-source and commercial low-cost devices in small satellites missions[J]. Acta Astronautic, 2023, 211: 37 − 48. doi: 10.1016/j.actaastro.2023.06.001
    [2]
    MATTHEWS P. The great debate: should COTS components be used in space[J]. Microwave Journal, 2022, 65(10): 80.
    [3]
    BUDROWEIT J, PATSCHEIDER H. Risk assessment for the use of COTS devices in space systems under consideration of radiation effects[J]. Electronics, 2021, 9(10): 1008.
    [4]
    ELBURN E, SOOD B, DAS D, et al. Utilization of data and models for COTS part reliability assessment[C]//2019 Annual Reliability and Maintainability Symposium(RAMS).
    [5]
    CHAN S. Reliability evaluation of COTS integrated circuits for military and space applications[J]. Journal of Korean Society Aeronautical and Space Sciences, 2012, 40(12): 1093 − 1098.
    [6]
    杨东升, 张贺, 冯佳运, 等. 电子封装微纳连接技术及失效行为研究进展[J]. 焊接学报, 2022, 43(11): 126 − 136.

    YANG Dongsheng, ZHANG He, FENG Jiayun, et al. Research progress on micro nano connection technology and failure behavior in electronic packaging[J]. Transactions of the China Welding Institution, 2022, 43(11): 126 − 136.
    [7]
    XIAN J W. Cu6Sn5 crystal growth mechanisms during solidification of electronic interconnections[J]. Acta Materialia, 2017, 126: 540 − 551. doi: 10.1016/j.actamat.2016.12.043
    [8]
    BAI T, QIAO Y, WANG X, et al. Finite element method modeling of temperature gradient-induced Cu atomic thermo migration in Cu/Sn/Cu micro solder joint[J]. Microelectronics Reliability, 2022, 129: 114479. doi: 10.1016/j.microrel.2022.114479
    [9]
    FANG Y. Coupling effects of mechanical vibrations and thermal cycling on reliability of CCGA solder joints[J]. Microelectronics Reliability, 2015, 55(11): 2396 − 2402. doi: 10.1016/j.microrel.2015.06.118
    [10]
    MAO M, WANG W, LU C, et al. Machine learning for board-level drop response of BGA packaging structure[J]. Microelectronics Reliability, 2022, 134: 114553. doi: 10.1016/j.microrel.2022.114553
    [11]
    LIU Y, YAO C, SUN F, et al. Numerical simulation of reliability of 2.5D/3D package interconnect structure under temperature cyclic load[J]. Microelectronics Reliability, 2021, 125: 114343. doi: 10.1016/j.microrel.2021.114343
    [12]
    SINGH B, MENEZES G, MCCANN S, et al. Board-level thermal cycling and drop-test reliability of large, ultrathin glass BGA packages for smart mobile applications[J]. IEEE Transactions on Components Packaging and Manufacturing Technology, 2017, 7(5): 726 − 733. doi: 10.1109/TCPMT.2017.2684464
    [13]
    LI G, FENG J, TIAN Yanhong, et al. Finite element analysis of underfill effect on the CBGA package reliability under thermal cycling[C]//International Conference on Electronic Packaging Technology (ICEPT), 2022.
    [14]
    撒子成, 王尚, 冯佳运, 等. SiP器件组装焊点形态预测及其随机振动可靠性仿真研究[J]. 机械工程学报, 2022, 58(2): 276 − 283.

    SA Zicheng, WANG Shang, FENG Jiayun, et al. Simulation of SiP solder joint geometry and random vibration reliability prediction[J]. Chinese Journal of Mechanical Engineering, 2022, 58(2): 276 − 283.
    [15]
    LI G, WANG S, TIAN Y, et al. Solder joint shape optimization and thermal-mechanical reliability improvement for microwave RF coaxial connectors[J]. Microelectronics Reliability, 2024, 154: 115345. doi: 10.1016/j.microrel.2024.115345
    [16]
    杨雪霞, 孙勤润, 张伟伟. 基于响应曲面法的BGA焊点结构参数优化设计[J]. 焊接学报, 2023, 44(11): 36 − 41. doi: 10.12073/j.hjxb.20220810002

    YANG Xuexia, SUN Qinrun, ZHANG Weiwei. Optimization design of BGA solder joint structure parameters based on response surface methodology[J]. Transactions of the China Welding Institution, 2023, 44(11): 36 − 41. doi: 10.12073/j.hjxb.20220810002
    [17]
    WU W, LI G, WANG S, et al. Study on the solder joint reliability of new diamond chip resistors for power devices[J]. Coatings, 2023, 13(4): 748. doi: 10.3390/coatings13040748
    [18]
    PECHT M. Creep fatigue models of solder joints: A critical review[J]. Microelectronics and reliability, 2016, 59: 1 − 12. doi: 10.1016/j.microrel.2016.01.013
    [19]
    LEE W W, NGUYEN L T, SELVADURAY G S. Solder joint fatigue models: review and applicability to chip scale packages[J]. Microelectronics Reliability, 2000, 40(2): 231 − 244. doi: 10.1016/S0026-2714(99)00061-X
  • Related Articles

    [1]ZENG Jie, TAN Haohao, YANG Fang, ZHOU Wangjun, LI Liangxing, CHANG Guiqin, LUO Haihui. Reliability analysis of solder layer of IGBT module under passive thermal cycling[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2023, 44(7): 123-128. DOI: 10.12073/j.hjxb.20220517002
    [2]NAN Xujing, LIU Xiaoyan, CHEN Leida, ZHANG Tao. Effect of thermal cycling on reliability of solder joints of ceramic column grid array package[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2021, 42(2): 81-85. DOI: 10.12073/j.hjxb.20200331003
    [3]WANG Yanfei, GENG Luyang, GONG Jianming, JIANG Wenchun. Finite element simulation on residual stress and deformation for welding joint of 20MnMoNb super-thick tube sheet of ethylene oxide reactor[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2012, (11): 63-66.
    [4]YE Huan, XUE Songbai, ZHANG Liang, WANG Hui. Finite element analysis on reliability of lead-free soldered joints for CSP device[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2009, (11): 93-96.
    [5]JI Feng, XUE Songbai, ZHANG Liang, WANG Hui. Finite element analysis on soldered joint reliability of QFN device[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2009, (10): 57-60.
    [6]GAO lili, XUE Songbai, ZHANG Liang, SHENG Zhong. Finite element analysis on the soldered joint reliability of FCBGA device[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2008, (8): 73-76.
    [7]GAO Lili, XUE Songbai, ZHANG Liang, SHENG Zhong. Finite element analysis on influencing factors of soldered column reliability in a CCGA device[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2008, (7): 93-96.
    [8]SHENG Zhong, XUE Songbai, ZHANG Liang, GAO Lili. Effect of leads pitch on soldered joint reliability of QFP device with finite element analysis[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2008, (5): 85-88.
    [9]ZHANG Liang, XUE Songbai, LU Fangyan, HAN Zongjie. Finite element analysis on soldered joint reliability of QFP device with different solders[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2007, (10): 45-48, 52.
    [10]ZHANG Liang, XUE Songbai, LU Fangyan, HAN Zongjie. Finite element analysis on soldered joint reliability of QFP device with different lead materials[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2007, (6): 65-68.

Catalog

    Article views (65) PDF downloads (15) Cited by()

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return