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SUN Feng-lian, ZHAO Mi, LI Dan, GU Feng. Interfacial reaction layers and microstructure of brazed joint of CVD diamond film[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2006, (9): 70-72.
Citation: SUN Feng-lian, ZHAO Mi, LI Dan, GU Feng. Interfacial reaction layers and microstructure of brazed joint of CVD diamond film[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2006, (9): 70-72.
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Interfacial reaction layers and microstructure of brazed joint of CVD diamond film

  • College of Materials Science and Engineering, Harbin University of Science and Technology, Harbin 150040, China

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  • Received Date: August 22, 2005
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  • The research object of this paper is the brazed CVD diamond thick film and cemented carbide using a Ag-Cu-Ti active filler alloy. The morphology and microstructure of the joint were investigated by scanning electron microscope and electronic probe micro-analysis. The new compound formed in the interface and the influence of brazing parameter on it was analyzed. The microstructure physical model of the joint was suggested.Results show that a gray interfacial reaction layer TiC is formed between filler metal and diamond under a certain brazing condition. TiCu reaction layer near TiC exists in the interface. Fracture often occurs in the reaction layer TiC, sometimes, it occurs in the TiCu layer also. Heating temperature, holding time and the composition of Ti in the active filler alloys effect the microstructure physical model of the joint between CVD diamond thick film and cemented carbide.
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