Advanced Search
HAN Lishuai, HUANG Chunyue, LIANG Ying, KUANG Bing, HUANG Genxin. Analysis of stress strain and shape size optimization of 3D micro-scale CSP solder joints in random vibration[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2019, 40(6): 64-70. DOI: 10.12073/j.hjxb.2019400156
Citation: HAN Lishuai, HUANG Chunyue, LIANG Ying, KUANG Bing, HUANG Genxin. Analysis of stress strain and shape size optimization of 3D micro-scale CSP solder joints in random vibration[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2019, 40(6): 64-70. DOI: 10.12073/j.hjxb.2019400156

Analysis of stress strain and shape size optimization of 3D micro-scale CSP solder joints in random vibration

More Information
  • Received Date: May 04, 2018
  • Three-dimensional finite analysis models of micro-scale chip-scale package were set up in ANSYS. Micro-scale chip-scale package (CSP) solder joints were analyzed in the random vibration of loads, then stress and strain distribution of micro-scale CSP were obtained. And the effects of different solder materials, pad diameter, and solder joint volume to stress and strain of micro-scale CSP solder joints were analyzed. The size of the solder joint, solder joint height, the diameter of pad size as design parameters, the value of stress of the micro-scale CSP solder joints as the target value are applied to design and calculation of 17 sets of experiments using computational simulation. The stresses and shape parameters of micro-scale CSP solder joints are fitted by the response surface method and genetic algorithm for fitting function optimization. The results show:the CSP solder joint parameters with the minimum value of stress in the random vibration is, the maximum size of 0.093 mm solder joint, the height of solder joint is 0.077 mm, the radius of the pad is 0.068 mm. Finally, the optimal combination is verified by simulation experiments:the result of optimal combination is better than 17 sets of experimental results, and the optimization of the micro-scale CSP solder joint structure in the random vibration is realized.
  • 张翼,薛齐文,王云峰.微电子封装发展历史与新动态[J].机械工程自动化, 2016, 2(1):215-216 Zhang Yi, Xue Qiwen, Wang Yunfeng. Development history and new trends of microelectronic packaging[J]. Mechanical Engineering&Automation, 2016, 2(1):215-216
    尹立孟,张新平.无铅微互连焊点力学行为尺寸效应的试验及数值模拟[J].机械工程学报, 2010, 46(2):55-60 Yin Limeng, Zhang Xinping. Experiment and numerical simulation of size effect of mechanical behaviors of lead-free micro-interconnect solder joints[J]. Journal of Mechanical Engineering, 2010, 46(2):55-60
    尹立孟,杨艳,刘亮岐.电子封装微互连焊点力学行为的尺寸效应[J].金属学报, 2009, 45(4):422-427 Yin Limeng, Yang Yan, Liu Liangqi. Size effect of mechanical behavior of miniature solder Joint interconnections in electronic packaging[J]. Acta Metallurgica Sinica, 2009, 45(4):422-427
    周洪彪,无铅微焊点热循环可靠性及寿命预测研究[D].哈尔滨:哈尔滨工业大学, 2008.
    沈星,基于3D-TSV叠层封装的Sn单晶粒微凸点研究[D].武汉:华中科技大学, 2013.
    Zha X, Liu C, Silberschmidt V V. Thermo-mechanical behaviour analysis of Micro-solder Joints by finite element modeling[C]//IEEE Conference Publications, 2012:1329-1332.
    Wei Guoqiang, Liu Henglin, Du Longchun, et al. Effect of electromigration and isothermal aging on interfacial microstructure and tensile fracture behavior of SAC305/Cu solderjoint[J]. China Welding, 2016, 25(3):42-48.
    Kim Y K, Hwang D S. PBGA packaging reliability assessments under random vibrations for space applications[J]. Microelectronics Reliability, 2015, 55(1):172-179.
    Tang W, Jing B, Huang Y F, et al. Feature extraction for latent fault detection and failure modes classification of board-level package under vibration loadings[J]. Science China Technological Sciences, 2015, 58(11):1905-1914.
    王红芳,赵玫,陈永国. Flip Chip焊点振动疲劳寿命预测模型[J].上海交通大学学报, 2001, 35(12):1855-1857 Wang Hongfang, Zhao Mei, Chen Yongguo. Vibration fatigue life prediction model for Flip Chip solder joint[J]. Jourual of shang hai jiao tong university, 2001, 35(12):1855-1857
    韦何耕,黄春跃,梁颖,等.热循环加载条件下PBGA叠层无铅焊点可靠性分析[J].焊接学报, 2013, 34(10):91-94 Wei Hegeng, Huang Chunyue, Liang Ying, et al. Reliability analysis of plastic ball grid array double-bump lead-free solder joint under thermal cycle[J]. Transactions of the China Welding Institution, 2013, 34(10):91-94
    玄光男,程润伟.遗传算法与工程设计[M].北京:科学出版社, 2000.
  • Cited by

    Periodical cited type(9)

    1. 杨雪霞,孙勤润,张伟伟. 基于响应曲面法的BGA焊点结构参数优化设计. 焊接学报. 2023(11): 36-41+131 . 本站查看
    2. 杨雪霞,孙勤润,王超,彭银飞,张伟伟. 基于随机振动过程应力分析的BGA焊点结构优化. 电子学报. 2023(10): 2783-2790 .
    3. 邵凤山,何峥纬,刘豪,华腾飞,仇原鹰,李静. 热循环加载下微系统封装结构有限元仿真方法研究. 微电子学与计算机. 2023(11): 121-127 .
    4. 李鹏,赵鲁燕. 挠性基板叠装互联结构随机振动模态分析. 电子设计工程. 2022(01): 41-45 .
    5. 孙勤润,杨雪霞,刘昭雲,王超,彭银飞. 基于有限元仿真的BGA焊点可靠性分析. 电子器件. 2022(04): 860-865 .
    6. 李鹏,潘开林,赵鲁燕. 挠性基板叠装互联组件随机振动响应分析. 电子机械工程. 2021(02): 17-21 .
    7. 孙磊,张屹,陈明和,张亮,苗乃明. 3D封装芯片焊点可靠性有限元分析. 焊接学报. 2021(01): 49-53+100 . 本站查看
    8. 李鹏,赵鲁燕,潘开林. 埋置空气隙柔性凸点结构随机振动应力应变分析. 电子元件与材料. 2021(07): 702-709 .
    9. 罗宁,陈精一,许庭生. 具有周边硅通孔的晶圆级芯片封装有限元分析. 电子与封装. 2020(04): 15-20 .

    Other cited types(9)

Catalog

    Article views (385) PDF downloads (85) Cited by(18)

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return