高级检索

基于边缘增强超分辨率的小径管焊缝缺陷识别

Defect recognition of small pipe welds based on edge enhancement super-resolution method

  • 摘要: 针对压力管道小径管射线数字成像(digital radiography, DR)检测中存在的图像分辨率低、焊缝背景复杂及微小缺陷难以识别等问题,文中提出了一种基于改进YOLOv11n的焊缝缺陷检测算法.首先,设计了适用于灰度图像的超分辨率算法,即频率感知注意力网络(frequency-aware attention network, FAAN),在提升图像整体清晰度的同时,有效保留了缺陷区域的边缘细节.其次,在主干网络中引入改进自适应韦伯对比度卷积(adaptive weber-contrast convolution, AWC-Conv)模块,增强模型对不同尺寸缺陷的特征提取能力.最后,文中采用针对微小缺陷优化的PIoU(Pixel-focused IoU)损失函数,通过像素级聚焦提升复杂背景下小缺陷的定位精度.试验结果表明,该算法在自建小径管焊缝DR图像数据集上的平均精度均值 P_\textmAP@0.5 达到94.2%,较原始YOLOv11n提升5.3%,显著提高了小径管焊缝缺陷的识别准确率与定位可靠性,能够满足实际工程中高精度自动化检测的需求.

     

    Abstract: Aiming at the problems including low image resolution, complex weld background and difficult identification of tiny defects existing in Digital Radiography (DR) inspection for small-diameter tubes of pressure pipelines, this paper proposes a weld defect detection algorithm based on improved YOLOv11n. Firstly, a Frequency-Aware Attention Network (FAAN), a super-resolution algorithm applicable to grayscale images, is designed to improve the overall definition of images while effectively preserving edge details of defect regions. Secondly, an improved Adaptive Weber-Contrast Convolution (AWC-Conv) module is introduced into the backbone network to strengthen the feature extraction capability of the model for defects with diverse sizes. Finally, the Pixel-focused Intersection over Union (PIoU) loss function optimized for tiny defects is adopted to boost the localization accuracy of small defects under complex backgrounds via pixel-level focusing. Experimental results demonstrate that the mean Average Precision at IoU threshold 0.5 ( P_\textmAP@0.5 ) of the proposed algorithm reaches 94.2% on the self-built DR image dataset of small-diameter tube welds, which is 5.3% higher than that of the original YOLOv11n. The proposed method remarkably improves the recognition accuracy and localization reliability of weld defects on small-diameter tubes, and can satisfy the requirements of high-precision automatic inspection in practical engineering applications.

     

/

返回文章
返回