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基于平行缝焊的封装管壳随机振动疲劳寿命研究

Study on random vibration fatigue life of encapsulation shells based on parallel seam welding

  • 摘要: 文中旨在探讨基于平行缝焊工艺的混合集成电路(Hybrid integrated circuit, HIC)封装管壳在随机振动载荷下的疲劳寿命及失效机制,为封装管壳的疲劳设计与优化提供理论依据. 首先,采用平行缝焊工艺将10钢底座与4J42合金盖板焊接制备封装管壳,并通过焊缝微观组织分析验证焊接质量,发现焊缝区域组织均匀、过渡平滑,无明显宏观缺陷. 随后,开展随机振动试验并结合断口分析确定失效模式. 结果表明,当随机振动加载方向垂直于盖板且振动量级达到25 g时,盖板长边中部焊缝内部区域发生疲劳失效,裂纹从焊缝边缘萌生并沿盖板厚度方向扩展. 此外,通过正弦振动试验,利用ABAQUS软件对封装管壳进行有限元分析,计算其危险位置的应力响应,并基于失效次数和应力数据构建S-N曲线. 最后,通过反傅里叶变换将随机振动应力频域数据转换为时域数据,并利用雨流计数法和线性损伤累积法预测疲劳寿命,结果表明封装管壳在承受20 g随机振动载荷时的疲劳寿命约为37.69 h

     

    Abstract: This study aims to investigate the fatigue life and failure mechanism of hybrid integrated circuit(HIC) encapsulation shells fabricated using parallel seam welding under random vibration loads, providing theoretical support for their fatigue design and optimization. First, encapsulation shells were prepared by welding 10 steel bases with 4J42 alloy covers using parallel seam welding technology. The welding quality was verified through microstructure analysis, revealing uniform structures, smooth transitions, and no obvious macroscopic defects in the weld zone. Subsequently, random vibration tests were conducted, and failure modes were determined through fracture surface analysis. The results showed that when the random vibration loading direction was perpendicular to the cover plate and the vibration level reached 25 g, fatigue failure occurred in the weld zone at the middle of the long edge of the cover plate, with cracks initiating at the weld edge and propagating along the thickness of the cover plate. Additionally, sinusoidal vibration tests were performed, and finite element analysis was conducted using ABAQUS to calculate the stress response at critical locations, based on which an S-N curve of the encapsulation shell was constructed. Finally, stress frequency-domain data under random vibration were transformed into time-domain data using inverse Fourier transform, and the fatigue life was predicted using the rain-flow counting method and linear damage accumulation law. The results indicated that the fatigue life of the encapsulation shell under a 20 g random vibration load was approximately 37.69 hours.

     

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