高级检索

基于热-结构耦合的叠层金凸点应力分析

邵良滨, 黄春跃, 梁颖, 周兴金, 赖宇阳

邵良滨, 黄春跃, 梁颖, 周兴金, 赖宇阳. 基于热-结构耦合的叠层金凸点应力分析[J]. 焊接学报, 2017, 38(1): 31-34.
引用本文: 邵良滨, 黄春跃, 梁颖, 周兴金, 赖宇阳. 基于热-结构耦合的叠层金凸点应力分析[J]. 焊接学报, 2017, 38(1): 31-34.
SHAO Liangbin, HUANG Chunyue, LIANG Ying, ZHOU Xingjin, LAI Yuyang. Study on stacked AU bumps stress based on thermal-structure coupling[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2017, 38(1): 31-34.
Citation: SHAO Liangbin, HUANG Chunyue, LIANG Ying, ZHOU Xingjin, LAI Yuyang. Study on stacked AU bumps stress based on thermal-structure coupling[J]. TRANSACTIONS OF THE CHINA WELDING INSTITUTION, 2017, 38(1): 31-34.

基于热-结构耦合的叠层金凸点应力分析

基金项目: 国家自然科学基金资助项目(51465012);广西壮族自治区自然科学基金资助项目(2012GXNSFAA053234、2013GXNS-FAA019322);四川省教育厅科研资助项目(13ZB0052)

Study on stacked AU bumps stress based on thermal-structure coupling

  • 摘要: 建立了叠层金凸点三维有限元分析模型,通过Isight软件对该模型进行了热-结构耦合分析,获取了热-结构耦合条件下叠层金凸点等效应力的分布规律,分析了叠层金凸点结构尺寸变化对应力的影响,通过方差分析获得了下层凸点直径、下层凸点高度、上层凸点直径、上层凸点高度因素对应力影响的显著性.结果表明,最大应力点都出现于远端角落处的凸点,随着凸点高度的增加,最大应力值逐渐减小.在置信度为90%的情况下,下层凸点直径对应力有显著影响,因素显著性排序为,下层凸点直径最大,其次为上层凸点直径,再次为下层凸点高度,最后是上层凸点高度.
    Abstract: The 3D finite element analysis models of stacked AU bumps were developed, by using Isight software. The thermal-structure coupling analysis of the model was performed, the equivalent stress distribution of stacked AU bumps was obtained under the condition of thermal-structure coupling. The influence of the changes in stacked AU bumps structure on stress was studied. The influence significance of the below bump diameter, the below bump height, the above bump diameter, the above bump height on stress were obtained by variance analysis. The results of study show, the maximum stresses appear in the outer bump; With the increase of the bump height the highest stresses decrease gradually, with 99% confidence, the below bump diameter have highly significant impact on the stress, the below bump diameter, the above bump diameter, the below bump height, the above bump height affect the stress in a descending order.
  • [1] Hueners B. Flipchip attach alternatives[J]. Advanced Packaging, 2005, 14(5):29-32.
    [2] 刘曰涛. 面向电子封装的钉头金凸点制备关键技术及其实验研究[D]. 哈尔滨:哈尔滨工业大学, 2009.
    [3] Li J, Wang D, Duan J, et al. Structural design and control of a small-MRF damper under 50N soft-Landing applications[J]. IEEE Transactions on Industrial Informatics, 2015, 11(3):612-619.
    [4] Li J, Zhang X, Zhou C, et al. New applications of an automated system for high-power LEDs[J]. IEEE/ASME Transactions on Mechatronics, 2016, 21(2):1035-1042.
    [5] Li J H, Xia Y, Wang W, et al. Dipping process characteristics based on image processing of pictures captured by high-speed cameras[J]. Nano-Micro Letters, 2015, 7(1):1-11.
    [6] 韦何耕, 黄春跃, 梁颖, 等. 热循环加载条件下PBGA叠层无铅焊点可靠性分析[J]. 焊接学报, 2013, 34(10):91-94. Wei Hegen, Huang Chunyue, Liang Ying, et al. Reliability analysis of plastic ball grid array double-bump lead-free solider joint under thermal cycle[J]. Transactions of the China Welding Institution, 2013, 34(10):91-94.
    [7] Son H Y, Kim I, Lee S B, et al. Thermal cycling reliability of Cu/SnAg double-bump flip chip assemblies for 100μm pitch applications[J]. Journal of Applied Physics, 2009, 105(1):13522-13527.
    [8] Yann K W, Johnson R W, Stapleton R, et al. Double bump flip-chip assembly[J]. IEEE Transactions on Electronics Packaging Manufacturing, 2006, 29(2):119-133.
    [9] 马潇. 典型PBGA封装热-结构分析及其优化[D]. 西安:西安电子科技大学, 2013.
    [10] 李孝轩. 微波多芯片组件微组装关键技术及其应用研究[D]. 南京:南京理工大学, 2009.
    [11] 韩宗杰, 李孝轩, 胡永芳, 等. 倒装芯片钉头凸点工艺技术[J]. 电子机械工程, 2012, 28(3):58-61. Han Zongjie, Li Xiaoxuan, Hu Yongfang, et al. Stud bump bonding technology of flip chip[J]. Electro-Mechanical Engineering, 2012, 28(3):58-61.
    [12] 杨德. 试验设计与分析[M]. 北京:中国农业出版社, 2002.
    [13] 何少华, 文竹青, 娄涛. 试验设计与数据处理[M]. 长沙:国防科技大学出版社,2002.
计量
  • 文章访问数:  514
  • HTML全文浏览量:  2
  • PDF下载量:  440
  • 被引次数: 0
出版历程
  • 收稿日期:  2014-12-25

目录

    /

    返回文章
    返回