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热冲击条件下倒装组装微焊点的可靠性--应力应变

Micro-joint reliability of flip chip assembly under thermal shock-strain and stress

  • 摘要: 采用有限元模拟法,研究倒装组装芯片在-55~125℃热冲击过程中微焊点所承受的应力和应变,对微互连焊点的裂纹生长情况进行分析.结果表明,芯片最外侧焊点具有最大的累积塑性应变能密度,为组装体中最易失效焊点;累积塑性应变能密度主要集中在芯片侧镍焊盘附近,在外侧最大,向内侧逐渐递减,这表明裂纹形成在芯片侧,沿着焊盘由外侧向内侧扩散,最终穿过整个焊点.试验结果与模拟分析相一致,进一步验证了模拟结果对裂纹生长的分析.

     

    Abstract: The stress and strain of soldered joints under thermal shock were studied, and the crack growth in soldered joint were also analyzed. The results show that the corner soldered joint has the most accumulated plastic strain and plastic work density, which is the critical soldered joint in the assembly.The accumulated plastic work density is mainly located in chip sidenear Ni pad. The largest value is in the outside, and decreases along the Ni pad to inside, which indicate the crack formed on the chip side, and then grew along Ni pad from outside to inside, at last crossed through the whole soldered joint. The experimental result matched the simulation analysis well, and further proved the analysis of crack growth in soldered joint.

     

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