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结构形式对多芯片子系统激光密封质量的影响

Laser welding technology of multi-chip subsustem shell and cover

  • 摘要: 利用激光焊接的优点,采用ANSYS软件对多芯片子系统Al-50Si壳体与盖板(4047铝合金)激光密封的结构进行分析,并进行了实物验证.结果表明,结构形式是影响多芯片子系统激光密封质量的关键因素,方形结构激光焊缝应力比异形结构高出36%以上(根据ANSYS分析结果),实物验证的方形结构激光焊缝气密性比异形结构低一个数量级.其原因是激光焊接后,方形结构的焊缝因焊接应力产生了焊接裂纹,影响了焊缝的气密性.采用Al-50%Si复合材料制作的多芯片子系统壳体与4047铝合金盖板异形接头形式,可以有效地降低激光焊缝的应力,从而避免焊接裂纹的产生.结果表明,异形结构的焊缝氦泄漏率可以达到8.9×10-9 Pa·m3/s,满足了多芯片子系统壳体气密封装要求.

     

    Abstract: Adopted the advantages of laser welding and by use of ANSYS software,the structure of the Al-50Si shell and the cover (4047 aluminum alloy) of the multi-chip subsystems which sealed by laser welding was analyzed,and the physical verification was also carried out. It was proved that structure form is the key factor which affected the quality of multi-chip subsystems which sealed by laser welding,the stress in laser weld of square structure is 36% higher than that in special-shaped structure (according to ANSYS analysis results),and the air tightness of the square structure is lower by almost one order of magnitude than that of special-shaped structure,which performed by physical verification. The reason is that after laser welding,the welding cracks induced by welding stress in the weld of square structure, so as to affect the air tightness of the weld. By adopt of specialshaped structure of multi-chip subsystems made from Al-50Si composite materials and the cover made from 4047 aluminum alloy, the stress in the welds can be effectively reduced,so the cracks in the weld are actually avoidable during laser welding. The result was indicated that the helium leak rate of the weld of special-shaped structure can reach to 8.9×10-9 Pa·m3/s, which met the hermetic package requirement of multi-chip subsystems.

     

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